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Current Issue of GO SEMI & BEYOND

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A Smarter SmarTest: ATE Software for the Next Generation of Electronics

The complexity of the ICs being designed into consumer and communications devices continues to increase. The 10-nanometer (nm) node is here, and some chipmakers are already beginning to turn out 7-nm devices. With smaller transistors that pack more and more functionality on a single chip, the complexity of test programs is increasing apace with that of the ICs themselves.
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Storage Evolution Driving Growth of System-Level Test

Thanks in large part to the booming mobile market, global demand for storage capacity continues unabated. Gartner indicates that solid-state drive (SSD) shipments are on pace to top 370 million units by 2020, while Research & Markets forecasts that the client SSD market alone will grow at a compound annual rate (CAGR) of 36 percent between 2017 and 2021. With this growth comes an increased drive for performance, requiring implementation of new/updated storage protocols.
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5G Lessons Learned from Automotive Radar Test

Situated between microwave and infrared waves, the millimeter-wave spectrum is the band of spectrum between 30 gigahertz (GHz) and 300GHz. It is used for high-speed wireless communications and is widely considered as the means to bring 5G into the future by allocating more bandwidth to deliver faster, higher-quality video, and multimedia content and services. Automotive radar is the entry point into millimeter wave for testing purposes.
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FEATURED HIGHLIGHTS

Advantest Shines at SEMICON West 2017

The annual SEMICON West show, held July 11-13, 2017, at the Moscone Center in San Francisco, proved once again to be a great venue for interacting with customers, press and analysts, as well as promoting Advantest’s extensive product portfolio.
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Advantest to Debut New Solid-State-Drive Testers and Present Technical Papers at Flash Memory Summit, August 8-10 in Santa Clara, California

Advantest Corporation will showcase the latest additions to its MPT3000 series of solid-state drive (SSD) test solutions and present two technical papers at this year’s Flash Memory Summit on August 8-10 at the Santa Clara Convention Center. Advantest is an emerald sponsor of the 2017 Summit.
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FEATURED TECHNOLOGY

Five Key Success Factors for Automotive Device Test

The number of automotive-related semiconductor devices being designed into vehicles has been growing rapidly due to increased requirements associated with safety, in-vehicle entertainment, and advanced driver assistance systems. As ADAS content advances, we move closer to autonomous vehicle driving, which will require even more devices.
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SPOTLIGHT ON MEMORY TECHNOLOGY

Interview with Jin Yokoyama

Advantest recently announced the T5822, the latest addition to its highly successful T5800 series of memory testers. In this issue’s Q&A, Jin Yokoyama, Functional Manager of Memory Test, talks about the new tester, which performs wafer-level test of DRAMs, NAND flash devices, and other non-volatile memories (NVMs).
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ADVANTEST NEWS

UPCOMING EVENTS

Please plan to visit or join Advantest at these upcoming events:

FLASH MEMORY SUMMIT
August 8-10, Santa Clara, CA
https://www.flashmemorysummit.com/

SEMICON TAIWAN
September 13-15, Taipei, Taiwan
http://www.semicontaiwan.org/en/

GSA EXECUTIVE FORUM
September 26, Silicon Valley
https://www.gsaglobal.org/2017usef/

INTERNATIONAL TEST CONFERENCE
October 31-November 2, Fort Worth, TX
http://www.itctestweek.org/

ISTFA
November 5-9, Pasadena, CA
http://www.asminternational.org/web/istfa-2017

GSA ASIA PACIFIC EXEC FORUM
November 8, Taipei, Taiwan
https://www.gsaglobal.org/gsa-events/presentations/2017-asia-pacific-executive-forum/

AAPS
November 12-15, San Diego, CA
https://www.aaps.org/Meetings_and_Professional_Development/Future_Annual_Events/

SEMICON EUROPA
November 14-17, Munich, Germany
http://www.semiconeuropa.org/

GSA AWARDS DINNER
December 7, Santa Clara, CA
https://www.gsaglobal.org/gsa-awards-dinner-celebration-december-7-2017/

SEMICON JAPAN
December 13-15, Tokyo, Japan
http://www.semiconjapan.org/en/?vlang=en

ON THE LIGHTER SIDE…

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