Earlier this month, Advantest announced Pin Scale 5000B, an enhanced digital test solution for the V93000 EXA Scale Platform designed to address the growing test requirements of advanced artificial intelligence (AI) and high-performance computing (HPC) devices.
AI and HPC semiconductor capabilities and complexity are growing swiftly, driven by advanced process nodes, heterogeneous integration and chiplet-based architectures. These devices require significantly higher structural and functional test coverage and processing of rapidly increasing volumes of test data.
The Pin Scale 5000B card significantly expands available vector memory, offering deep and scalable storage capacity aligned with industry demands. Hardware and software facilitate optimal memory usage in chiplet-based architectures, reducing customers' overall consumption and associated costs while addressing evolving memory requirements for the future. The new card also enables customers to efficiently scale their existing test programs and hardware configurations in response to evolving device requirements.
This solution is engineered to accommodate contemporary scan fabric architectures, enabling concurrent testing of multiple IP cores using a streaming approach. Its new hardware capabilities allow test results to be observed across multiple cores within a single test pattern execution, enabling instantaneous insights into error distribution among the cores. These capabilities help improve structural coverage and core-level visibility, significantly reducing test times and cost-of-test.
The Pin Scale 5000B delivers high-bandwidth test access, offering data rates up to 5 Gbps through the proven pin electronics architecture of the Pin Scale 5000. Pin Scale 5000B is a fully compatible superset of the established Pin Scale 5000, complementing the V93000 portfolio.
