SEMICON Japan 2025 was held at Tokyo Big Sight from December 17-19. We showcased the company's latest test solutions under this year's theme, "AI x Sustainability x Semiconductors."
Advantest's booth attracted nearly 4,000 visitors, including semiconductor-related companies, investors, media representatives, and government officials, marking a significant increase in booth attendance compared to last year.
The booth featured a variety of new products, such as a cutting-edge memory test cell that integrates the M5241 memory handler and the high-speed T5801 memory test system, specially designed to test next-generation DRAM devices. Additionally, we showcased the new MTe test system for power devices, the T2000 AiR2X next-generation air-cooled test system, our SiConic™ Silicon Photonics test solution (which automates silicon verification and design verification), and the E3660 MASK CD-SEM tool. This year's booth also hosted a joint Advantest Cloud Solutions™ (ACS) and NVIDIA exhibition—a collaboration to pioneer a new era of AI-powered semiconductor testing. The diversity of products on display demonstrated our industry-leading range of technological capabilities that support the semiconductor value chain.
In addition to this year's product display, Advantest participated in SEMICON Japan's technical program, hosting talks and giving presentations at the Advanced Packaging and Chiplet Summit (APCS), the SEMI Technology Symposium (STS), and the AI x Sustainability Pavilion.
We appreciate the opportunity to participate in this year's show and the hard work of all of those who contributed to its success. We look forward to seeing everyone again at SEMICON 2026.