November 2017 Issue
Scalable Platform Key to Controlling SSD Test Costs
Manufacturers of solid-state drives (SSDs) want to keep test costs under control even as device performance, density, and variety all increase. In addition, the SSD product life cycle is accelerating. Test equipment manufacturers must strike a reasonable balance here. They must provide more capable but less expensive systems that can cover a wider variety of devices. One approach is to make the test system modular and scalable, so companies can buy what they need now and add on later as they need more features and more capabilities.
Inline Contact Resistance Solves Wafer Probing Challenges
Testing is increasingly being conducted at the wafer level as well as at lower voltage levels, necessitating even greater test accuracy. Achieving this accuracy is often hampered by poor contact resistance (Cres). In this environment, conventional continuity tests – in which current is applied in parallel to all pins and per-pin diode voltage is measured to verify continuity between the tester and the internal die – are not adequate for determining yield limiting contact problem. Moreover, they have no value in determining potential issues with probe card degradation over time.
A Unique Software Interface for Design and Production
Before device test can take place on automated test equipment (ATE), device-specific test programs need to be developed for the target device and test system. As part of this process, a large amount of digital test content (patterns) gets translated from EDA (design/simulation) to ATE (test) format and needs to be debugged and characterized on the target tester.
Advantest’s VOICE 2018 Call for Papers Ends Nov. 17
VOICE, the annual Advantest Developer Conference, has issued an international call for papers for the 2018 event focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and other hot topics. Paper submissions will be accepted through November 17, 2017.VOICE, the annual Advantest Developer Conference, has issued an international call for papers for the 2018 event focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and other hot topics. Paper submissions will be accepted through November 17, 2017.
W2BI’s New MLT1600 Device Test Automation Platform Addresses LTE, GSM and WCDMA Capabilities for the Burgeoning IoT and Smartphone Markets
W2BI, an Advantest Group company and a global leader in wireless device test automation products for the world’s top wireless operators, suppliers and labs, has introduced the MLT1600 cloud-enabled, device test automation tester as the newest member of its Micro Line Tester portfolio. The MLT1600 addresses the testing challenges of IoT products across multiple cellular radio technologies – such as GSM, WCDMA and LTE – with a 70-MHz to 6-GHz frequency range. With its portable design and small footprint, the MLT1600 leverages W2BI’s existing cloud-based test management platform to acquire on-demand test cases and publish test results as required across all test parameters.
SPOTLIGHT ON BUSINESS
Advantest Taiwan CEO Guides with Balanced Leadership Approach
The subject of this issue’s Q&A is C.H. Wu, chairman, president and CEO of Advantest Taiwan. Mr. Wu has served in these roles since 2006, and in 2012, he was named an executive officer with Advantest Corporation. He holds a bachelor’s degree in electrical engineering from Taiwan’s Lunghwa University of Science and Technology and an MBA from Saginaw Valley State University in Michigan.
- Advantest to Participate in 2017 International Test Conference in Fort Worth, Texas, October 31- November 2
- Advantest’s VOICE 2018 Developer Conference Opens Call for Papers Highlighting Hot Topics in Semiconductor Testing
- Advantest selected as Index Component for the SNAM Sustainability Index
Please plan to visit or join Advantest at these upcoming events:
November 14-17, Munich, Germany
November 14-17, Munich, Germany
November 19-23, Okayama, Japan
November 28, Airport City, Israel
GSA AWARDS DINNER
December 7, Santa Clara, CA
December 13-15, Tokyo, Japan
ON THE LIGHTER SIDE…
Do you have questions, comments or feedback about GO SEMI & BEYOND? Let us know!