Current Issue of GO SEMI & BEYOND
Engineering Test Station Facilitates Post-Silicon Validation
The semiconductor market is evolving, with devices becoming more complex as chip designers add cores and pursue 2.5D and 3D integration strategies. This complexity presents challenges extending from design and simulation through system-level test (SLT), where a device is exercised in mission mode, booting up an operating system and running end-user code, for example. Read More.
Industrial Solutions for Machine-Learning-Enabled Yield Optimization and Test
According to market research firm Gartner, Inc., in assessing the completion rate of data science projects, as well as the bottom-line value they generate for their companies, only between 15 and 20 percent of these projects are ever completed. Moreover, of those that do manage to reach completion, less than 10 percent of them generate value, according to feedback provided by corporate CEOs. The bottom line: less than 2 percent of data science projects ever get completed AND deliver value. How can this squandering of corporate investment and effort be alleviated? Read More.
Wave Scale RF8: Ready for Wi-Fi 7
Since Advantest launched the Wave Scale family of test cards for the V93000 system-on-chip (SoC) test platform five years ago, we have continually added new products and capabilities to the line, allowing us to address new, emerging test demands. The Wave Scale RF8 card addresses the test challenges associated with the forthcoming Wi-Fi 7 standard by providing the bandwidth needed in an industry-proven instrument. Read More.
A Customized Low-Cost Approach for S-Parameter Validation of ATE Test Fixtures
Device under test (DUT) fixtures for ATE system pose several verification challenges. Users need to measure the DUT test fixture quickly and easily, while making sure the measurements mimic the ATE-to-test-fixture interface performance and determining how to handle DUT ball grid array (BGA)/socket measurement. These challenges are further highlighted by the unique issues faced individually by probing on the ATE side and on the DUT side of the test fixture. Read More.
The global semiconductor industry is poised for a decade of growth and is projected to become a trillion-dollar industry by 2030. What do you consider to be the most impactful megatrend going forward?
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SPOTLIGHT ON BUSINESS
Q&A Interview with Fabio Marino – CREA Brings Power Semiconductor Know-how to Advantest
In June 2022, Advantest announced its acquisition of Italian ATE company CREA. As leading developer and provider of equipment for testing power semiconductors, CREA brings vital capabilities to Advantest’s portfolio of test solutions. To delve further into the acquisition and how it will benefit Advantest’s customers, we talked with Fabio Marino, director of Advantest’s Power, Analog and Controller Business. Read More.
Advantest Enables PCIe Gen 5 NVMe & CXL Device Testing on Proven MPT3000 SSD Test Systems
Advantest announced that its MPT3000 solid-state drive (SSD) test systems are the industry’s first with the ability to test PCI Express fifth-generation (PCIe Gen 5) devices, including those utilizing the new Compute Express Link™ (CXL™) interconnect standard. Read More.
Advantest Introduces Industry’s First Flexible DUT Interface
Advantest launched its DUT Scale Duo interface for the V93000 EXA Scale SoC test systems, enabling the industry’s highest level of parallelism for testing advanced semiconductors. With this revolutionary interface, the usable space on DUT boards and probe cards is increased by 50 percent or more while wafer probe and final-test setups can accommodate component heights that are more than three times taller. Read More.
Advantest Adds System-Level Testing Capability for Advanced Memory ICs
Advantest installed its first enhanced T5851-STM16G tester capable of nonvolatile memory express (NVMe) system-level test coverage at a major manufacturer of IC memory devices. By expanding the capabilities of its established T5851 platform, Advantest addresses the growing market for testing NVMe solid-state drives (SSDs) using ball-grid arrays (BGAs) in automotive applications. Read More.
Advantest’s 2022 VOICE Developer Conference Concludes with Record Attendance
Advantest held its VOICE 2022 Developer Conference on May 17-18 in Scottsdale, Arizona, achieving maximum attendance and sponsorship capacity. Over 300 people attended the event, the majority of whom were Advantest customers and partners. The 2022 conference represented over 60 companies and included presentations of more than 60 technical papers over two days. Read More.
More than Moore or More Moore?
What’s Next in the Future of High-Performance Computing? In this episode of the podcast, experts discuss the plans for the coming era of computing and reveal how the semiconductor industry is continuously evolving to address the looming high performance compute challenges — moving us beyond Moore’s Law. Read More.
ADVANTEST IN THE NEWS
- Advantest Launches Universal VI and Power Supply Card for V93000 EXA Scale SoC Test System
- Integrated Annual Report 2022 now Available
- Advantest Announces Call for Papers for VOICE 2023 Developer Conference in Santa Clara, California
- Advantest to Participate in 2022 International Test Conference in Anaheim, California
- Advantest Launches ACS Solution Store to Enable Real-Time Data Analytics Solutions for Semiconductor Test
Big Sight Tokyo
Tokyo, Japan, December 14-16, 2022