T5833 Memory Test System

To keep pace with users’ performance demands in the booming market for mobile electronics, the semiconductors that drive smart phones and tablet computers as well as the servers that support them – primarily DRAMs, NAND Flash memories, multi-chip packages (MCPs) and next-generation non-volatile memories including MRAM, RRAM and PCM — are becoming faster and higher capacity. This raises the need for test solutions that have both the high functionality to test today’s most advanced memory ICs and the cost-efficient operation to address high-volume consumer markets.

The versatile T5833 memory test system combines industry-leading performance and low cost of test to maximize customers’ return on investment. The tester is designed to perform both wafer sort and final test across a wide range of memory devices including LPDDR3-DRAMs, MCPs, high-speed NAND flash memories and next-generation non-volatile memory ICs.

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DPS128

One of three new modules recently launched in support of the V93000 test platform with universal per-pin architecture, the DPS128 (device power supply) is part of a family of power-supply instruments designed to provide a cost-efficient response to the trend toward higher multi-site parallelism. The DPS128 features 128 channels of voltage/current (VI) resources per module to accurately source and measure both current and voltage. Its modular architecture, based on Advantest’s test-processor backbone, can be configured in multiple ways. This built-in flexibility and expandability is key to the power supply’s ability to meet future testing needs.

The DPS128’s per-pin time measurement unit (TMU) enables efficient measurement of high switching frequencies, duty cycles and fast rise/fall times found in today’s advanced power-management devices. With its sophisticated ganging options, this family of instruments can address a broad application space, and also supersedes legacy power instruments within the V93000 portfolio.

This new product family has been instrumental to the growing success of the V93000 in the microcontroller, smartcard, sensor and automotive segments, because it enables very small and attractive system configurations (few cards) with high versatility.

SoC customers have widely accepted the new instruments, and Advantest shipped roughly 1,500 units within the first year. This steep ramp is a first in the history of the V93000 platform. The majority of the units are meeting the high-volume production needs of customers located in Asia.

The products in the DPS family set a new milestone in versatility and cost efficiency, and Advantest looks forward to seeing them contribute further to our growing SoC business.

PVI8

In 2014, Advantest announced its new PVI8 floating power source for the V93000 universal per-pin test platform. The new instrument adds high-voltage and high-current test capabilities to Advantest’s universal V93000 platform, and broadens its market to embedded power devices. Typical target applications in this area are motor controller ICs for automotive and industrial usage and a broad range of power-management devices, including high-power buck and boost converters.

The PVI8 features high channel density and lower test time compared to competitive systems. Designed with eight floating channels and four-quadrant operation, the new instrument can be used to provide up to 80 volts and up to 10 amps per channel. The eight-channel PVI8 can be ganged up to ±80 amps for high-power stress testing of devices. For high-voltage tests, the PVI8 can be stacked up to ±160 volts due to its floating design. The power source supports native pattern controlled operation and therefore leads to extremely fast test times with stable parametric measurements.

Current customers for the PVI8 are leading IDMs in the automotive area. One of these IDM customers is using the power source to test a series of embedded Power MCUs for automotive body electronics. The high channel density, rich feature set and high-throughput of the V93000 power solution provides compelling test cost for embedded power devices.

Efficient test development is essential for these complex applications to meet their short time-to-production requirements. A software package for automatic creation of high-throughput-pattern controlled setups and measurements enables the creation of high-throughput test solutions with reduced engineering effort.

For more information, visit Advantest.com.