October 2020 Issue
System-Level Test Methodologies Take Center Stage
Because electronic systems for all applications in end-user markets must provide the highest possible reliability to match customers’ quality expectations, semiconductor components undergo multiple tests and stress steps to screen out defects that could arise during their lifecycle. Due to new semiconductor devices’ increasing design complexity and extreme process technology, increased test coverage is needed to meet stricter quality requirements. Read More.
Wave Scale RF8 – Enabling the Next WAVE in RF Communications Test
Over the years, Advantest has remained at the forefront of test innovation through close collaboration with customers and partners, and by keeping our finger on the pulse of industry and market trends. We launched the Wave Scale family of test cards for our V93000 system-on-chip (SoC) test platform just over four years ago, and in that short time, we have greatly expanded the line with new products designed to meet burgeoning test demands – e.g., Wave Scale RF, Wave Scale MX, and Wave Scale Millimeter. Read More.
High-Volume Production Test of AiP Modules for 5G Applications
The arrival of 5G promises enhanced mobile broadband (eMBB), massive machine-type communication (mMTC), and ultrareliable low-latency communication (URLLC). But as 5G rolls out, the test community faces challenges and opportunities. That’s particularly true regarding the antenna arrays that will connect handsets to base stations. Read More.
The pandemic has spurred the growth of virtual conferences and trade shows. Many encourage networking and are interactive, even allowing for the virtual attendee to get involved in Q&A sessions. What do you think about virtual events?
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SPOTLIGHT ON BUSINESS
Q&A Interview with Steve Pateras, Senior Director of Test Marketing for Synopsys – VOICE 2021 Keynote Update
In this issue, our Q&A interview subject is Steve Pateras, Senior Director of Test Marketing for Synopsys. Steve provides a look at a new test capability, jointly developed by Synopsys and Advantest, that leverages high-speed communication interfaces such as USB and PCIexpress to improve test throughput. (NOTE: This piece was originally intended to serve as a preview of Steve’s VOICE 2020 keynote address; although canceled this year, the conference will return in 2021, as will Steve.) Read More.
New Memory Tester Integrates Burn-In and Core Testing for 5G Product Development
Advantest has added to its H5600 family of memory testers by introducing the new, highly versatile H5620ES engineering test system, designed for both high-speed burn-in and core testing of today’s DDR4, next-generation DDR5, and low-power, double-data-rate (LPDDR) devices in laboratory environments. By streamlining the number of accessories and reducing the time required between burn-in and core testing, the new H5620ES shrinks the cost of test for evaluating advanced memory devices used throughout 5G applications. Read More.
Advantest’s New TS9001 Time Domain Reflectometry (TDR) System Employs Terahertz Technology to Provide High Resolution Analysis of Circuit Faults
Advantest Corporation announced that it has initiated sales of its new TS9001 TDR System. The new system fully utilizes the company’s unique terahertz technology to enable non-destructive and high-resolution analysis on circuit faults in advanced semiconductor packages, such as flip chip BGAs, wafer level packages, and 2.5D/3D ICs. Read More.
Advantest Extends its Global Reach at the First-Ever Virtual SEMICON West 2020
For the first time, the SEMICON West 2020 trade show commenced on July 20-23, 2020 as a full-on virtual event. To stay connected with its customers, Advantest returned as a Gold Sponsor and exhibited a virtual booth featuring graphics and videos of its latest end-to-end IC test solutions for cutting-edge applications such as 5G and artificial intelligence (AI). Read More.
Advantest’s myAdvantest Online Portal Provides 24/7 Access to Digital Products and Web-Based Services
Advantest has introduced a new online portal enabling customers to place orders and get instant delivery of Advantest’s cloud-based services and software products, making these items available on demand, anytime and anywhere. Users can access the myAdvantest portal from any internet-connected device without having to install an app or software program. Read More.
- Advantest Introduces Evolutionary V93000 EXA Scale™ SoC Test System
- Advantest to Participate in the First Virtual SEMICON Southeast Asia on August 11-21
- Advantest Joins RE100 Global Renewable Energy Initiative
- Advantest Recognized at 2019 Environmental Human Resources Development Corporate Awards
- Advantest and PDF Solutions Announce Partnership to Build Advantest Cloud Powered by Exensio
- Advantest Cancels VOICE 2020 Developer Conference in Scottsdale Over Continuing Concerns Surrounding COVID-19
- Advantest Selected for MSCI Japan Empowering Women (WIN) Index and MSCI Japan Empowering Women (WIN) Select Index
- Advantest Donates to 2020 Kyushu Floods Recovery Efforts
- Advantest to Participate in the First-Ever Virtual SEMICON West on July 20-23
- Advantest’s New TS9001 Time Domain Reflectometry (TDR) System Employs Terahertz Technology to Provide High Resolution Analysis of Circuit Faults
- Advantest Opens myAdvantest, an Online Portal Providing 24/7 Access to Digital Products and Web-Based Services
- Advantest Launches New IC Memory Tester That Integrates Burn-In and Core Testing for 5G Product Development
- IR Technical Briefing Presentation Material (System Level Test)
International Test Conference
Washington, DC, November 3-5, 2020
Virtual, October 26-November 5, 2020 https://www.aaps.org/pharmsci/register
Flash Memory Summit
Virtual, November 10-12, 2020
Munich, Germany, November 10-13, 2020
Dusseldorf, Germany, November 16-19, 2020
Airport City, Israel, November 17, 2020
Virtual, December 11-18, 2020